晶体管可靠性
Get the transistor junction temperature distribution ( thermal spectrum) have great influence on the thermal resistance measurements, the choice of maximum applied power, and whole system reliability.
得到晶体管结温分布对于热阻的测量、最大施加功率的选择、整机的可靠性有着十分重要的意义。
Multiple parallel MOSFET driven by the transistor is applied in the charging and discharging control circuit. The design not only improves the circuit reliability, but also prevents the damage of reverse charging.
充电和放电控制电路采用三极管驱动多组并联的MOSFET管,不仅提高了电路的可靠性,还起到了防止蓄电池反充的保护功能。
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